Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Exploiting Narrow-Width Values for Thermal-Aware Register File Designs
- Authors
- Sung Woo Chung
- Publisher
- IEEE
- Citation
- Design, Automation and Test in Europe Conference
- Conference Name
- Design, Automation and Test in Europe Conference
- Place
- FR
- Conference Date
- 2009-04-14
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.