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Radiation damage effects in Ga2O3 materials and devices

Authors
Kim, JihyunPearton, Stephen J.Fares, ChakerYang, JianchengRen, FanKim, SuhyunPolyakov, Alexander Y.
Issue Date
7-1월-2019
Publisher
ROYAL SOC CHEMISTRY
Citation
JOURNAL OF MATERIALS CHEMISTRY C, v.7, no.1, pp.10 - 24
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF MATERIALS CHEMISTRY C
Volume
7
Number
1
Start Page
10
End Page
24
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/68323
DOI
10.1039/c8tc04193h
ISSN
2050-7526
Abstract
The strong bonding in wide bandgap semiconductors gives them an intrinsic radiation hardness. Their suitability for space missions or military applications, where issues of radiation tolerance are critical, is widely known. Especially beta-Ga2O3, an ultra-wide bandgap material, is attracting interest for power electronics and solar-blind ultraviolet detection. Beside its superior thermal and chemical stabilities, the effects of radiation damage on Ga2O3 are of fundamental interest in space-based and some terrestrial applications. We review the effect on the material properties and device characteristics of proton, electron, X-ray, gamma ray and neutron irradiation of beta-Ga2O3 electronic and optoelectronic devices under conditions relevant to low earth orbit of satellites containing these types of devices.
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