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Small-Area High-Accuracy ODT/OCD by calibration of Global On-Chip for 512M GDDR5 application
- Authors
- KIM, Chulwoo
- Publisher
- IEEE
- Citation
- IEEE Custom Integrated Circuits Conference, pp.717 - 720
- Conference Name
- IEEE Custom Integrated Circuits Conference
- Place
- US
- Conference Date
- 2009-11-03
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Collections - College of Engineering > School of Electrical Engineering > 2. Conference Papers
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