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Heterostructure WSe2-Ga2O3 Junction Field-Effect Transistor for Low-Dimensional High-Power Electronics

Authors
Kim, JanghyukMastro, Michael A.Tadjer, Marko J.Kim, Jihyun
Issue Date
5-9월-2018
Publisher
AMER CHEMICAL SOC
Keywords
wide bandgap semiconductor; heterostructure; two-dimensional material; field-effect transistor; gallium oxide
Citation
ACS APPLIED MATERIALS & INTERFACES, v.10, no.35, pp.29724 - 29729
Indexed
SCIE
SCOPUS
Journal Title
ACS APPLIED MATERIALS & INTERFACES
Volume
10
Number
35
Start Page
29724
End Page
29729
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/73137
DOI
10.1021/acsami.8b07030
ISSN
1944-8244
Abstract
Layered materials separated from each bulk crystal can be assembled to form a strain-free heterostructure by using the van der Waals interaction. We demonstrated a heterostructure n-channel depletion-mode beta-Ga2O3 junction field-effect transistor (JFET) through van der Waals bonding with an exfoliated p-WSe2 flake. Typical diode characteristics with a high rectifying ratio of similar to 10(5) were observed in a p-WSe2/n-Ga2O3 heterostructure diode, where WSe2 and beta-Ga2O3 were obtained by mechanically exfoliating each crystal. Layered JFETs exhibited an excellent I-DS-V-DS output as well as I-DS-V-GS transfer characteristics with a high on/off ratio (similar to 10(8)) and low subthreshold swing (133 mV/dec). Saturated output currents were observed with a threshold voltage of -5.1 V and a three-terminal breakdown voltage of +144 V. Electrical performances of the fabricated heterostructure JFET were maintained at elevated temperatures with outstanding air stability. Our WSe2-Ga2O3 heterostructure JFET paves the way to the low-dimensional high-power devices, enabling miniaturization of the integrated power electronic systems.
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