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On/off ratio enhancement in single-walled carbon nanotube field-effect transistor by controlling network density via sonication

Authors
Jang, Ho-KyunChoi, Jun HeeKim, Do-HyunKim, Gyu Tae
Issue Date
30-6월-2018
Publisher
ELSEVIER SCIENCE BV
Keywords
Single-walled carbon nanotube; Field-effect transistor; Network; Monte-Carlo method; On/off ratio
Citation
APPLIED SURFACE SCIENCE, v.444, pp.442 - 447
Indexed
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
444
Start Page
442
End Page
447
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/74880
DOI
10.1016/j.apsusc.2018.03.050
ISSN
0169-4332
Abstract
Single-walled carbon nanotube (SWCNT) is generally used as a networked structure in the fabrication of a field-effect transistor (FET) since it is known that one-third of SWCNT is electrically metallic and the remains are semiconducting. In this case, the presence of metallic paths by metallic SWCNT (m-SWCNT) becomes a significant technical barrier which hinders the networks from achieving a semiconducting behavior, resulting in a low on/off ratio. Here, we report on an easy method of controlling the on/off ratio of a FET where semiconducting SWCNT (s-SWCNT) and m-SWCNT constitute networks between source and drain electrodes. A FET with SWCNT networks was simply sonicated under water to control the on/off ratio and network density. As a result, the FET having an almost metallic behavior due to the metallic paths by m-SWCNT exhibited a p-type semiconducting behavior. The on/off ratio ranged from 1 to 9.0 x 10(4) along sonication time. In addition, theoretical calculations based on Monte-Carlo method and circuit simulation were performed to understand and explain the phenomenon of a change in the on/off ratio and network density by sonication. On the basis of experimental and theoretical results, we found that metallic paths contributed to a high off-state current which leads to a low on/off ratio and that sonication formed sparse SWCNT networks where metallic paths of m-SWCNT were removed, resulting in a high on/off ratio. This method can open a chance to save the device which has been considered as a failed one due to a metallic behavior by a high network density leading to a low on/off ratio. (C) 2018 Elsevier B.V. All rights reserved.
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공과대학 (전기전자공학부)
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