Electrical characteristics of silicon nanowire CMOS inverters under illumination
- Authors
- Yoo, Jeuk; Kim, Yoonjoong; Lim, Doohyeok; Kim, Sangsig
- Issue Date
- 5-2월-2018
- Publisher
- OPTICAL SOC AMER
- Citation
- OPTICS EXPRESS, v.26, no.3, pp.3527 - 3534
- Indexed
- SCIE
SCOPUS
- Journal Title
- OPTICS EXPRESS
- Volume
- 26
- Number
- 3
- Start Page
- 3527
- End Page
- 3534
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/77382
- DOI
- 10.1364/OE.26.003527
- ISSN
- 1094-4087
- Abstract
- In this study, we examine the electrical characteristics of complementary metal-oxide-semiconductor (CMOS) inverters with silicon nanowire (SiNW) channels on transparent substrates under illumination. The electrical characteristics vary with the wavelength and power of light due to the variation in the generation rates of the electric-hole pairs. Compared to conventional optoelectronic devices that sense the on/off states by the variation in the current, our device achieves the sensing of the on/off states with more precision by using the voltage variation induced by the wavelength or intensity of light. The device was fabricated on transparent substrates to maximize the light absorption using conventional CMOS technologies. The key difference between our SiNW CMOS inverters and conventional optoelectronic devices is the ability to control the flow of charge carriers more effectively. The improved sensitivity accomplished with the use of SiNW CMOS inverters allows better control of the on/off states. (c) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
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