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Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V

Authors
Ko, EunahLee, Jae WooShin, Changhwan
Issue Date
4월-2017
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Steep switching; negative capacitance FinFET; ferroelectric capacitor; S/D extension length (L-ext)
Citation
IEEE ELECTRON DEVICE LETTERS, v.38, no.4, pp.418 - 421
Indexed
SCIE
SCOPUS
Journal Title
IEEE ELECTRON DEVICE LETTERS
Volume
38
Number
4
Start Page
418
End Page
421
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/83926
DOI
10.1109/LED.2017.2672967
ISSN
0741-3106
Abstract
In this letter, an n-type short-channel negative capacitance FinFET (NC-FinFET) with a hysteresis window of 0.48 V, an on-/off-current ratio of 10(7), and a sub20- mV/decade average subthreshold slope (SSavg) that is intended to overcome the Boltzmann limit (i. e., the physical limit in the SS, which is 60 mV/decade at 300 K), is experimentally demonstrated vs. a baseline FinFET with an SSavg of similar to 105 mV/decade. In our testing, we confirmed that the large hysteresis window in a short-channel NC-FinFET can be suppressed by using an appropriate source/drain extension length (L-ext). As Lext in the NC-FinFET is increased, the gate-to-source/drain capacitance (C-GS/C-GD) decreased and the hysteresis window narrows.
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