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Experimental evidence of negative quantum capacitance in topological insulator for sub-60-mV/decade steep switching device

Authors
Choi, H.Lee, H.Park, J.Yu, H. -Y.Kim, T. G.Shin, C.
Issue Date
14-11월-2016
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.109, no.20
Indexed
SCIE
SCOPUS
Journal Title
APPLIED PHYSICS LETTERS
Volume
109
Number
20
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/86836
DOI
10.1063/1.4968183
ISSN
0003-6951
Abstract
As a three-dimensional topological insulator (TI), bismuth telluride (Bi2Te3) has two-dimensional electron gas on its surface where negative quantum capacitance (NQC) can exist at a specific biasing condition. In order to experimentally confirm NQC in a TI, a metal-insulator-semiconductor (MIS) capacitor (i.e., metal-Bi2Te3-SiO2-silicon) is fabricated. The capacitance-voltage measurement of the MIS capacitor at 300K shows that as the depletion capacitance in silicon decreases, the total capacitance of the MIS capacitor, which consists of two capacitors connected in series (i.e., insulator capacitor and depletion capacitor), increases in the depletion region at a frequency of 50 kHz. The amplified capacitance indicates the existence of NQC on the surface of the TI, and it originates from the strongly correlated electron system. The NQC of the TI opens avenues for sub-60-mV/decade steep switching silicon devices. Published by AIP Publishing.
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공과대학 (전기전자공학부)
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