A Scalable Bandwidth Mismatch Calibration Technique for Time-Interleaved ADCs
- Authors
- Park, Yunsoo; Kim, Jintae; Kim, Chulwoo
- Issue Date
- 11월-2016
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Analog-to-digital conversion; bandwidth mismatch; channel mismatch; time-interleaved analog-to-digital converters (TI-ADCs) calibration
- Citation
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.63, no.11, pp.1889 - 1897
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
- Volume
- 63
- Number
- 11
- Start Page
- 1889
- End Page
- 1897
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/87080
- DOI
- 10.1109/TCSI.2016.2593927
- ISSN
- 1549-8328
- Abstract
- This paper presents a foreground calibration method for both a sampler and a track-and-hold (T/H) buffer bandwidth mismatch in highly time-interleaved analog-to-digital converters (TI-ADCs). The T/H buffer bandwidth mismatch stems from the length difference of interconnect lines between the buffer and the channel ADC, while the sampler bandwidth mismatch arises from the mismatch in a switch and a sampling capacitor. To address both mismatches along with other mismatches residing in TI-ADCs, this papers utilizes least-squares (LS) minimization technique in order to extract mismatch parameters while injecting a sinewave at two distinct frequencies. Programmable capacitor arrays (PCAs) are used to tune the bandwidth of sampler, and correcting buffer bandwidth mismatch is performed in digital-domain. The method presented here is scalable to arbitrary number of interleaved paths, and can easily be combined with existing calibration methods for gain, offset, and timing-skew mismatches. Numerical experiment via Monte-Carlo simulations demonstrates significant performance improvement in the spurious-free dynamic range (SFDR) from 38 dB to 75 dB for a 32-channel time-interleaved ADC model that includes all major mismatches.
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