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Ambipolar behavior in MoS2 field effect transistors by using catalytic oxidation

Authors
Choi, J. H.Jang, H. -K.Jin, J. E.Shin, J. M.Kim, D. -H.Kim, G. -T.
Issue Date
31-10월-2016
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.109, no.18
Indexed
SCIE
SCOPUS
Journal Title
APPLIED PHYSICS LETTERS
Volume
109
Number
18
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/87131
DOI
10.1063/1.4966898
ISSN
0003-6951
Abstract
Modulation of electrical properties in MoS2 flakes is an attractive issue from the point of view of device applications. In this work, we demonstrate that an ambipolar behavior in MoS2 field effect transistors (FETs) can be easily obtained by heating MoS2 flakes under air atmosphere in the presence of cobalt oxide catalyst (MoS2 + O-2 -> MoOx + SOx). The catalytic oxidation of MoS2 flakes between source-drain electrodes resulted in lots of MoOx nanoparticles (NPs) on MoS2 flakes with thickness reduction from 64 nm to 17 nm. Consequently, N-type behavior of MoS2 FETs was converted into ambipolar transport characteristics by MoOx NPs which inject hole carriers to MoS2 flakes. Published by AIP Publishing.
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공과대학 (전기전자공학부)
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