Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A Charge-Recycling Assist Technique for Reliable and Low Power SRAM Design

Authors
Choi, WoongPark, Jongsun
Issue Date
8월-2016
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Assist; capacitive coupling; charge-recycling; read stability; SRAM; variation; write ability
Citation
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.63, no.8, pp.1164 - 1175
Indexed
SCIE
SCOPUS
Journal Title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
Volume
63
Number
8
Start Page
1164
End Page
1175
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/87996
DOI
10.1109/TCSI.2016.2589118
ISSN
1549-8328
Abstract
This paper presents a novel charge-recycling SRAM assist circuit to reduce the dynamic power consumption of SRAM assist technique. By collaboratively combining the read and write assist schemes, the wasted charge in conventional read assist circuit can be efficiently recycled in write assist technique. In order to compare the dynamic power consumption at ISO minimum operating voltage (VMIN) condition, the most probable failure point (MPFP) simulations are performed using 14 nm FinFET technology model. Compared to the conventional assist schemes, thanks to the charge-recycling, 41% power saving, and 2.3% area reduction can be achieved by using the proposed SRAM assist circuit.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Park, Jong sun photo

Park, Jong sun
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE