3D Non-Destructive Fluorescent X-Ray Computed Tomography With a CdTe Array
- Authors
- Yoon, Changyeon; Kim, Younghak; Lee, Wonho
- Issue Date
- 6월-2016
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- CdTe; characteristic X-ray; FXCT
- Citation
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.63, no.3, pp.1844 - 1853
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON NUCLEAR SCIENCE
- Volume
- 63
- Number
- 3
- Start Page
- 1844
- End Page
- 1853
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/88456
- DOI
- 10.1109/TNS.2016.2565478
- ISSN
- 0018-9499
- Abstract
- In this study, we develop 2D and 3D tomographic non-destructive tests for detecting fluorescence X-rays using a 2D CdTe array. Experiments were conducted using various phantoms and image-reconstruction methods. In general, conventional computed tomography analyzes materials according to attenuation coefficients and is highly dependent on the densities of the materials; thus, it is difficult to discriminate materials that have similar densities, even if their atomic numbers differ. In our research, materials were exposed to X-rays, and both conventional transmission images and fluorescent X-ray images were reconstructed using the information from characteristic X-rays detected using a 2D CdTe planar detector array. Since atoms have their own characteristic X-ray energies, our system was able to discriminate materials of the same or similar density if the materials had different atomic numbers. Additionally, the transmission and characteristic X-ray images were combined to analyze the positions, densities, and atomic numbers of the unknown materials. Several image-reconstruction methods were applied; the reconstructed images were compared to determine an optimized algorithm for fluorescence X-ray computed tomography.
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