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Strong interlayer exchange coupling and high post-annealing stability in perpendicularly magnetized [Pt/Co]/Ru/[Co/Pt] structures
- Authors
- Yun, Seok Jin; Lim, Sang Ho; Lee, Seong-Rae
- Issue Date
- Feb-2016
- Publisher
- AMER INST PHYSICS
- Citation
- AIP ADVANCES, v.6, no.2
- Indexed
- SCIE
SCOPUS
- Journal Title
- AIP ADVANCES
- Volume
- 6
- Number
- 2
- ISSN
- 2158-3226
- Abstract
- Strong interlayer exchange coupling (IEC) and high post-annealing stability are demonstrated for perpendicular synthetic ferrimagnets (p-SyFs) with [Pt/Co](6)/Ru/[Co/Pt](3) structures. The observed IEC strength was 2.55 ergs/cm(2) for a Ru thickness of 0.35 nm, representing the highest value achieved up to date for similar structures. The IEC remained strong even after annealing at 450 degrees C, for the practically important Ru layer thickness of 0.85 nm. The biquadratic IEC, a parameter quantifying the pinhole effects in SyFs, was confirmed by analyzing the experimental results by using the total energy functional, and its strength increased with decreasing the temperature and Ru layer thickness. (C) 2016 Author(s).
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Related Researcher
- LIM, Sang Ho
- College of Engineering (Department of Materials Science and Engineering)