All-Digital Duty-Cycle Corrector With a Wide Duty Correction Range for DRAM Applications

Abstract

An all-digital duty-cycle corrector with a wide duty correction range and fast correction time is hereby presented. The proposed corrector uses a 1-bit digital duty-cycle detector with a time-to-digital converter, and it achieves a duty correction range between 10% and 90% with a low pressure, volume, and temperature variation. The test chip was fabricated using a 0.13-mu m CMOS process, and it occupies an area of 0.059 mm(2). The correction cycle is a 14 cycles and the duty-cycle error is below +/- 1.4%. At an operating frequency of 1 GHz, the power dissipation and peak-to-peak jitter are measured at 5.6 mW and 20.5 ps, respectively.