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Charge-trap flash memory using zirconium-nitride-based memristor switches

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dc.contributor.authorKim, Hee-Dong-
dc.contributor.authorKim, Kyeong Heon-
dc.contributor.authorAn, Ho-Myoung-
dc.contributor.authorKim, Tae Geun-
dc.date.accessioned2021-09-04T10:45:03Z-
dc.date.available2021-09-04T10:45:03Z-
dc.date.created2021-06-10-
dc.date.issued2015-11-11-
dc.identifier.issn0022-3727-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/91918-
dc.description.abstractCharge-trap flash (CTF) memory using a zirconium nitride (ZrN)-based memristor switch (MRS) is demonstrated for next-generation nonvolatile memory. This device consists of a metal/MRS/nitride/oxide/silicon (M/MRS/N/O/S) structure so that electrical transport via the ZrN-based MRS layer can be utilized. Compared to previous oxide materials used as conduction paths, the proposed CTF device with a ZrN-based MRS exhibits a faster program/erase switching speed (20 ns/7 ns), along with comparable endurance and retention properties.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titleCharge-trap flash memory using zirconium-nitride-based memristor switches-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Tae Geun-
dc.identifier.doi10.1088/0022-3727/48/44/445102-
dc.identifier.scopusid2-s2.0-84946061616-
dc.identifier.wosid000365925800014-
dc.identifier.bibliographicCitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.44-
dc.relation.isPartOfJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.citation.titleJOURNAL OF PHYSICS D-APPLIED PHYSICS-
dc.citation.volume48-
dc.citation.number44-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordAuthorZrN-
dc.subject.keywordAuthorReCTF-
dc.subject.keywordAuthormemristor switch-
dc.subject.keywordAuthorblocking layer-
dc.subject.keywordAuthorfilament-
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