Interlayer exchange coupling between perpendicularly magnetized structures through a Ru/Ta composite spacer
- Authors
- Yun, Seok Jin; Lim, Sang Ho; Lee, Seong-Rae
- Issue Date
- 30-3월-2015
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.106, no.13
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 106
- Number
- 13
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/94082
- DOI
- 10.1063/1.4916731
- ISSN
- 0003-6951
- Abstract
- In stacks using a Ru/Ta composite spacer [Pt/Co](6)/Ru/Ta/CoFeB/MgO, both strong interlayer exchange coupling and perpendicular magnetic anisotropy are achieved. The composite spacer has the additional advantages of high post-annealing stability over a conventional Ru spacer; for a Ru (0.8 nm)/Ta (0.4 nm) spacer, where the antiparallel coupling is strongest, the coupling strength remains nearly constant at the highest annealing temperature of 375 degrees C. An interlayer exchange coupling is observed at very small Ru thicknesses down to 0.2 nm, which can be compared with the previous limit of 0.6 nm. (C) 2015 AIP Publishing LLC.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Materials Science and Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.