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A 0.15 V Input Energy Harvesting Charge Pump With Dynamic Body Biasing and Adaptive Dead-Time for Efficiency Improvement

Authors
Kim, JungmoonMok, Philip K. T.Kim, Chulwoo
Issue Date
2월-2015
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Body biasing; boost converter; charge pump; conversion efficiency; dc-dc converter; dead-time; energy harvesting; low voltage; threshold voltage; variation
Citation
IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.50, no.2, pp.414 - 425
Indexed
SCIE
SCOPUS
Journal Title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume
50
Number
2
Start Page
414
End Page
425
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/94446
DOI
10.1109/JSSC.2014.2375824
ISSN
0018-9200
Abstract
A charge pump using 0.13-mu m CMOS process for low-voltage energy harvesting is presented. A low-power adaptive dead-time (AD) circuit is used which automatically optimizes the dead-time according to the input voltage. A negative charge pump is also utilized for high efficiency at low input voltages (V-IN). The AD circuit improves efficiency by 17% at V-IN of 0.2 V compared to the fixed dead time circuit as well as enables the charge pump to work at VIN down to 0.15 V. Dynamic body bias (DBB) and switch-conductance enhancement techniques are applied to a unit stage of the three-stage charge pump. The reverse current flowing through the cross-coupled NMOS switches is prevented and the current transfer is also maximized. Together with the AD circuit and the DBB technique, the maximum output current was improved by 240% as compared to the conventional charge pump design using only the forward body bias.
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