Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms

Full metadata record
DC Field Value Language
dc.contributor.authorJeon, Dae-Young-
dc.contributor.authorPark, So Jeong-
dc.contributor.authorMouis, Mireille-
dc.contributor.authorBarraud, Sylvain-
dc.contributor.authorKim, Gyu-Tae-
dc.contributor.authorGhibaudo, Gerard-
dc.date.accessioned2021-09-05T01:47:58Z-
dc.date.available2021-09-05T01:47:58Z-
dc.date.created2021-06-15-
dc.date.issued2014-12-29-
dc.identifier.issn0003-6951-
dc.identifier.urihttps://scholar.korea.ac.kr/handle/2021.sw.korea/96444-
dc.description.abstractThe less surface roughness scattering effects, owing to the unique operation principle, in junctionless nanowire transistors (JLT-NW) were shown by low-temperature characterization and 2D numerical simulation results. This feature could allow a better current drive under a high gate bias. In addition, the dominant scattering mechanisms in JLT-NW, with both a short (L-M = 30 nm) and a long channel (L-M = 10 mu m), were investigated through an in-depth study of the temperature dependence of transconductance (g(m)) behavior and compared to conventional inversion-mode nanowire transistors. (C) 2014 AIP Publishing LLC.-
dc.languageEnglish-
dc.language.isoen-
dc.publisherAMER INST PHYSICS-
dc.subjectELECTRICAL CHARACTERIZATION-
dc.subjectCHANNEL WIDTH-
dc.subjectMOSFETS-
dc.titleLow-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Gyu-Tae-
dc.identifier.doi10.1063/1.4905366-
dc.identifier.scopusid2-s2.0-84949009011-
dc.identifier.wosid000347171300044-
dc.identifier.bibliographicCitationAPPLIED PHYSICS LETTERS, v.105, no.26-
dc.relation.isPartOfAPPLIED PHYSICS LETTERS-
dc.citation.titleAPPLIED PHYSICS LETTERS-
dc.citation.volume105-
dc.citation.number26-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusELECTRICAL CHARACTERIZATION-
dc.subject.keywordPlusCHANNEL WIDTH-
dc.subject.keywordPlusMOSFETS-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > School of Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Gyu Tae photo

Kim, Gyu Tae
공과대학 (전기전자공학부)
Read more

Altmetrics

Total Views & Downloads

BROWSE