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A Short-Channel TFT of Amorphous In-Ga-Zn-O Semiconductor Pixel Structure With Advanced Five-Mask Process

Authors
Yang, Joon-YoungJung, Sung-HoonWoo, Chang-SeungLee, Ju-HyunPark, Jung-HoJun, Myung-ChulKang, In-ByeongYeo, Sang-Deog
Issue Date
Oct-2014
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
a-IGZO; AMOLED; etch-stopper; LCD; oxide semiconductor; short channel
Citation
IEEE ELECTRON DEVICE LETTERS, v.35, no.10, pp.1043 - 1045
Indexed
SCIE
SCOPUS
Journal Title
IEEE ELECTRON DEVICE LETTERS
Volume
35
Number
10
Start Page
1043
End Page
1045
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/97359
DOI
10.1109/LED.2014.2349902
ISSN
0741-3106
Abstract
We propose a new five-mask etch-stopper amorphous In-Ga-Zn-O semiconductor pixel structure for a high-resolution advanced-high-performance in-plane-switching (AH-IPS) display device. A short-channel length (under 5 mu m) thin-film transistor (TFT) was successfully fabricated using a self-aligned damage preventing layer. The linear field effect mobility of the 4-mu m channel length TFT was 10.4 cm(2)/V.s. Using the proposed structure, we successfully fabricated a 9.7-in AH-IPS quad-extended graphics array liquid-crystal displays panel.
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