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Delayed < 111 > texture for improving the thermal stability of Ag reflectors for high-performance GaN-based light-emitting diodes
- Issue Date
- Jun-2014
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Keywords
- Semiconductor compounds; Metallizations; Annealing; X-ray diffraction (XRD); Texture
- Citation
- SCRIPTA MATERIALIA, v.80, pp.5 - 8
- Indexed
- SCIE
SCOPUS
- Journal Title
- SCRIPTA MATERIALIA
- Volume
- 80
- Start Page
- 5
- End Page
- 8
- ISSN
- 1359-6462
- Abstract
- The thermal stability of Ag-based reflectors for GaN-based light-emitting diodes (LEDs) was significantly improved by inserting an Mg layer. LEDs fabricated with the Mg-inserted reflector exhibited 22% higher output power (at 20 mA) than LEDs with the Ag-only reflector. The Mg-inserted Ag sample was less < 1 1 1 > textured than the Ag-only sample. Based on scanning electron microscopy and X-ray results, the improved stability is attributed to the delay in the < 1 1 1 > texturing and the modification of the surface energy of Ag films. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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Related Researcher
- SEONG, TAE YEON
- College of Engineering (Department of Materials Science and Engineering)