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SCIESCOPUS

Advanced semiconductor fabrication process control using dual filter exponentially weighted moving average

Ko, Hyo-Heon; Kim, Jihyun; Park, Sang-Hoon; Baek, Jun-Geol; Kim, Sung-Shick

ArticleIssue Date2012CitationJOURNAL OF INTELLIGENT MANUFACTURING, v.23, no.3, pp 443 - 455PublisherSPRINGER

SCIESCOPUS

Dispatching rule for non-identical parallel machines with sequence-dependent setups and quality restrictions

Ko, Hyo-Heon; Kim, Jihyun; Kim, Sung-Shick; Baek, Jun-Geol

ArticleIssue Date2010CitationCOMPUTERS & INDUSTRIAL ENGINEERING, v.59, no.3, pp 448 - 457PublisherPERGAMON-ELSEVIER SCIENCE LTD

KCI

Fault Detection of Cycle-Based Signals Using Wavelet Transform in FAB Processes

Kim, Jun Seok; Lee, Jae Hyun; Kim, Ji-Hyun; Baek, Jun-Geol; Kim, Sung-Shick

ArticleIssue Date2010CitationINTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.11, no.2, pp 237 - 246PublisherKOREAN SOC PRECISION ENG

SCIESCOPUS

Intelligent adaptive process control using dynamic deadband for semiconductor manufacturing

Ko, Hyo-Heon; Kim, Jun-Seok; Kim, Jihyun; Baek, Jun-Geol; Kim, Sung-Shick

ArticleIssue Date2011CitationEXPERT SYSTEMS WITH APPLICATIONS, v.38, no.6, pp 6759 - 6767PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCIESCOPUS

Spline regression based feature extraction for semiconductor process fault detection using support vector machine

Park, Jonghyuck; Kwon, Ick-Hyun; Kim, Sung-Shick; Baek, Jun-Geol

ArticleIssue Date2011CitationEXPERT SYSTEMS WITH APPLICATIONS, v.38, no.5, pp 5711 - 5718PublisherPERGAMON-ELSEVIER SCIENCE LTD

SCIESCOPUS

Supply chain network design and transshipment hub location for third party logistics providers

Kwon, Seungwoo; Park, Kyungdo; Lee, Chulung; Kim, Sung-Shick; Kim, Hak-Jin; Liang, Zhong

ArticleIssue Date2006CitationCOMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2006, PT 3, v.3982, pp 928 - 933PublisherSPRINGER-VERLAG BERLIN

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Browsing by Kim, Sung-ShickAuthor

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