Kim, J.; Yoon, D.; Son, H.; Kim, D.; Yoo, J.; Yun, J.; Ng, H.J.; Kaynak, M.; Rieh, J.
ArticleIssue Date2021CitationIEEE Transactions on Microwave Theory and Techniques, v.69, no.5, pp 2762 - 2775PublisherInstitute of Electrical and Electronics Engineers Inc.