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Application of nanosphere lithography to charge trap flash memories with patterned Si3N4 trap layers

Authors
An, Ho-MyoungKim, Hee-DongYou, Hee-WookKim, Kyeong HeonSung, Yun MoCho, Won-JuKim, Tae Geun
Issue Date
10월-2012
Publisher
ELSEVIER
Keywords
Charge trap flash; SONOS; Nanosphere lithography; Memory-trap density
Citation
MICROELECTRONIC ENGINEERING, v.98, pp.347 - 350
Indexed
SCIE
SCOPUS
Journal Title
MICROELECTRONIC ENGINEERING
Volume
98
Start Page
347
End Page
350
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/107308
DOI
10.1016/j.mee.2012.07.061
ISSN
0167-9317
Abstract
In this paper, nanosphere lithography (NSL) is applied to the surface of the Si3N4 trap layer in the charge trap flash device to improve its memory characteristics. A 500-nm-diameter polystyrene bead array was used as a mask to make patterns on the surface of the Si3N4 trap layer during etching processes using CF4 gases. The pattern depth measured by atomic force microscope was about 4 nm. The metal-aluminum oxide-nitride-oxide-silicon capacitor that has a patterned surface shows a larger capacitance-voltage memory window of 5 V, higher tunneling current at bias voltages higher than 10 V. and faster program speeds of 50 ms, as compared to those measured from the capacitor with the flat surface. These results are thought to be due to abundant memory traps available at the interface between the nitride and top oxide formed by NSL. (C) 2012 Elsevier B.V. All rights reserved.
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공과대학 (전기전자공학부)
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