Effect of oxidizing the ferromagnetic electrode in magnetic tunnel junctions on tunneling magnetoresistance
- Authors
- Joo, Sungjung; Jung, K. Y.; Lee, B. C.; Kim, Tae-Suk; Shin, K. H.; Jung, Myung-Hwa; Rho, K-J.; Park, J. -H.; Hong, Jinki; Rhie, K.
- Issue Date
- 23-4월-2012
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.100, no.17
- Indexed
- SCIE
SCOPUS
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 100
- Number
- 17
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/108704
- DOI
- 10.1063/1.4704557
- ISSN
- 0003-6951
- Abstract
- The ferromagnetic layer in magnetic tunnel junctions (MTJs) was oxidized with varying O-2 concentrations, and the corresponding effect on spin-dependent transport was studied. As expected from our previous results for MTJs with an over-oxidized AlOx tunnel barrier, a partially oxidized ferromagnetic layer plays an important role in spin-dependent transport. As the temperature is lowered, the junction resistance increases dramatically, and the tunneling magnetoresistance (TMR) is strongly suppressed. Increasing the O-2 concentration enhances the increase of resistance and suppression of TMR. This work supports our previous conclusion that oxidizing the ferromagnetic layer generates localized magnetic moments, which act as a scattering center for spin-polarized tunneling electrons. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4704557]
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Collections - College of Science and Technology > Semiconductor Physics in Division of Display and Semiconductor Physics > 1. Journal Articles
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