A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices
- Authors
- Joo, Min-Kyu; Kang, Pilsoo; Kim, Yongha; Kim, Gyu-Tae; Kim, Sangtae
- Issue Date
- 3월-2011
- Publisher
- AMER INST PHYSICS
- Citation
- REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.3
- Indexed
- SCIE
SCOPUS
- Journal Title
- REVIEW OF SCIENTIFIC INSTRUMENTS
- Volume
- 82
- Number
- 3
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/112993
- DOI
- 10.1063/1.3553208
- ISSN
- 0034-6748
- Abstract
- This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT. (C) 2011 American Institute of Physics. [doi:10.1063/1.3553208]
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.