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Dielectric properties of on-chip-cured polyimide films

Authors
Yoo, Kum-PyoLee, Myung JinKwon, Kwang-HoJeong, JaehwaMin, Nam-Ki
Issue Date
31-8월-2010
Publisher
ELSEVIER SCIENCE SA
Keywords
Dielectric properties; Polyimide; On-chip curing; Local curing technique
Citation
THIN SOLID FILMS, v.518, no.21, pp.5986 - 5991
Indexed
SCIE
SCOPUS
Journal Title
THIN SOLID FILMS
Volume
518
Number
21
Start Page
5986
End Page
5991
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/115854
DOI
10.1016/j.tsf.2010.05.099
ISSN
0040-6090
Abstract
Spin-coated polyimide thin films were locally cured using microelectromechanical system microhotplates as an alternative approach to the conventional wafer-level curing process The on-chip cured polyimide films were characterized Fourier transform infrared spectroscopy. The polyimide was found to be fully cured at a temperature over 350 degrees C for 1 h. The dielectric properties of 350 degrees C-cured polyimide films were measured over broad frequency, temperature, and humidity ranges. As is expected for most polymer materials, the dielectric constant decreased with increasing frequency due to dielectric relaxation, which may be due to the fact that multiple relaxation times (i.e. several types of polarization), rather than a single one are involved. The dissipation factor was very low and nearly flat for excitation frequencies less than 1 MHz Both the dielectric constant and the dissipation factor increased with increasing temperature from 10 degrees C to 90 degrees C. and relative humidity (RH) from 30%RH to 95%RH, with a steeper slope at lower frequencies. These results indicate that on-chip-cured polyimide films have weak low frequency dispersion due to the aging effect at high temperature and humidity (C) 2010 Elsevier B V. All rights reserved
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