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Growth of ZnO thin film on p-GaN/sapphire (0001) by simple hydrothermal technique

Authors
Sahoo, TrilochanKang, Eun-SilKim, MyoungKannan, VasudevanYu, Yeon-TaeShin, Dong-ChanKim, Tae-GeunLee, In-Hwan
Issue Date
1-2월-2008
Publisher
ELSEVIER
Keywords
crystal structure; X-ray diffraction; hydrothermal crystal growth; thin film; zinc compounds; semiconducting II-VI materials
Citation
JOURNAL OF CRYSTAL GROWTH, v.310, no.3, pp.570 - 574
Indexed
SCIE
SCOPUS
Journal Title
JOURNAL OF CRYSTAL GROWTH
Volume
310
Number
3
Start Page
570
End Page
574
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/124099
DOI
10.1016/j.jcrysgro.2007.11.026
ISSN
0022-0248
Abstract
Zinc oxide (ZnO) heteroepitaxial thin films were successfully grown on p-GaN/sapphire (0001) by single-step hydrothermal route at a low temperature of 90 degrees C. Continuous ZnO thin films with c-axis orientation were grown in aqueous solution of zinc acetate di-hydrate and ammonium hydroxide. X-ray diffraction, scanning electron microscopy and room temperature photoluminescence were carried out for structural, morphological and optical property analysis. The as-grown ZnO films showed preferential growth along (0001) direction. The in-plane orientation between ZnO thin film and p-GaN buffer layer was found to be [11 (2) over bar0](ZnO)parallel to[11 (2) over bar0](GaN). Sharp luminescence peak centered at 377nm due to excitonic recombination from ZnO thin film was observed. (C) 2007 Elsevier B.V. All rights reserved.
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공과대학 (전기전자공학부)
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