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A 65-nm 0.6-fJ/Bit/Search Ternary Content Addressable Memory Using an Adaptive Match-Line Discharge

Authors
Lee, KyeonghoChoi, WoongPark, Jongsun
Issue Date
8월-2021
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Adaptive sensing; content addressable memory (CAM); memory; reference voltage; sensing margin; ternary CAM (TCAM)
Citation
IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.56, no.8, pp.2574 - 2584
Indexed
SCIE
SCOPUS
Journal Title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume
56
Number
8
Start Page
2574
End Page
2584
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/136908
DOI
10.1109/JSSC.2020.3043186
ISSN
0018-9200
Abstract
This article presents an adaptive match-line (ML) discharge scheme for low-power, high-performance, and compact ternary content addressable memory (TCAM). In the proposed TCAM, the transposed cell topology enables the selectively controlled ML pull-down path and compact array area. By employing the adaptive ML discharge and ML boosting scheme, unnecessary ML discharge and redundant search-line (SL) switching are eliminated for low-cost TCAM search operation. In order to minimize ML voltage swing at a wide voltage range, a timing calibration scheme is also adopted in the proposed TCAM. A 128 x 64 test chip implemented with 65-nm CMOS technology shows that the proposed adaptive ML discharge improves up to 69% of search delay and saves 37% of search energy compared with the conventional approach at 1.1 V, 100 MHz. The measurement result shows energy efficiency of 0.6 fJ/bit/search and 8% improvement of figure-of-merit (FoM) (energy/bit/search) compared with the state-of-the-art works.
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공과대학 (전기전자공학부)
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