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The Effects of Oxygen Pessure on a-IGZO TFT during Sputtering ProcessThe Effects of Oxygen Pessure on a-IGZO TFT during Sputtering Process

Alternative Title
The Effects of Oxygen Pessure on a-IGZO TFT during Sputtering Process
Authors
Hong MunPyo
Issue Date
9-7월-2014
Publisher
KVS(The Korean Vaccuum Society)
Citation
ICMAP 2014 - International Confernce on Microelectronics and Plasma Technology 2014
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/39516
Conference Name
ICMAP 2014 - International Confernce on Microelectronics and Plasma Technology 2014
Place
KO
Conference Date
2014-07-08
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Graduate School > Department of Applied Physics > 2. Conference Papers

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