Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
평형점 주사탐침열현미경에 의한 그래핀과 기판 사이 열저항 계측Measuring the thermal contact resistance between graphene and insulating substrate by null-point scanning thermal microscope
- Alternative Title
- Measuring the thermal contact resistance between graphene and insulating substrate by null-point scanning thermal microscope
- Authors
- KWON, Oh Myoung
- Issue Date
- 5-4월-2013
- Publisher
- 열물성학회
- Citation
- 한국 열물성 학회 2013 춘계 학술대회
- Conference Name
- 한국 열물성 학회 2013 춘계 학술대회
- Place
- KO
서울
- Conference Date
- 2013-04-04
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Mechanical Engineering > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.