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ASPICEmodel of p-channel silicon tunneling field-effect transistors for logic applications

Authors
Woo, SolaJeon, JuheeKim, Sangsig
Issue Date
Jan-2021
Publisher
WILEY
Keywords
device modeling; SPICE model; TCAD simulation; tunnel FET; tunnel FET logic gate
Citation
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, v.34, no.1
Indexed
SCIE
SCOPUS
Journal Title
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS
Volume
34
Number
1
URI
https://scholar.korea.ac.kr/handle/2021.sw.korea/50636
DOI
10.1002/jnm.2793
ISSN
0894-3370
Abstract
In this study, we propose a SPICE model ofp-channel silicon tunneling field-effect transistors (TFETs) for logic applications. To verify our model, electrical characteristics of fabricatedp-TFETs are calibrated by utilizing TCAD and SPICE simulations. We simulate various logic gates, such as complementary TFET (c-TFET) inverters,c-TFET NAND gates, andc-TFET NOR gates using our TFET model. Our simulation shows that ac-TFET inverter can be operated atV(DD)as low as 0.3 V and thatc-TFET logic gates based on our model can operate similar to 1000 times higher frequency than conventional TFET logic gates.
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