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QUANTITATIVE SCANNING THERMAL MICROSCOPY WITH DOUBLE SCAN TECHNIQUE
- Authors
- KWON, Oh Myoung
- Keywords
- SThM (Scanning Thermal Microscope), Thermoelectric probe, Nanoscale temperature, AFM
- Issue Date
- 8-1월-2008
- Publisher
- ASME
- Citation
- 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
- Conference Name
- 2008 Proceedings of the ASME Micro/Nanoscale Heat Transfer International Conference, MNHT 2008
- Place
- CH
타이난 대만
- Conference Date
- 2008-01-06
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Collections - College of Engineering > Department of Mechanical Engineering > 2. Conference Papers
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