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Adaptive ECC for Tailored Protection of Nanoscale Memory
- Issue Date
- Nov-2017
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Error Correction Code (ECC); Memory Failures; Robust Nanoscale Memory; Run-time Protection; Variable ECC
- Citation
- IEEE DESIGN & TEST, v.34, no.6, pp.84 - 93
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE DESIGN & TEST
- Volume
- 34
- Number
- 6
- Start Page
- 84
- End Page
- 93
- ISSN
- 2168-2356
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- There are no files associated with this item.
- Appears in
Collections - College of Engineering > School of Electrical Engineering > 1. Journal Articles
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Related Researcher
- Park, Jong sun
- College of Engineering (School of Electrical Engineering)