Influence of thermal stress on heat-generating performance of indium tin oxide nanoparticle thin films
- Authors
- Yang, Kyungwhan; Cho, Kyoungah; Kim, Sangsig; Im, Kiju
- Issue Date
- 11월-2016
- Publisher
- A V S AMER INST PHYSICS
- Citation
- JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.34, no.6
- Indexed
- SCIE
SCOPUS
- Journal Title
- JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
- Volume
- 34
- Number
- 6
- URI
- https://scholar.korea.ac.kr/handle/2021.sw.korea/86917
- DOI
- 10.1116/1.4963832
- ISSN
- 1071-1023
- Abstract
- In this study, the authors investigate the influence of thermal stress on the heat-generating performance of indium tin oxide (ITO) nanoparticle (NP) thin films on quartz substrates. ITO NP thin films experience repeated thermal stresses during their electrical heating cycles. As the number of the heating cycles increases to 50, the highest temperature of the ITO NP thin film decreases from 317 to 221 degrees C. Our analysis of the temperature profiles, morphological images, and electrical resistance reveals that the degradation in the heat-generating performance is closely correlated with microcracks in the oxide thin film caused by thermal stresses. (C) 2016 American Vacuum Society.
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