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IEEE Transactions on Components and Packaging Technologies

ISSN

P 1521-3331

출판사

Institute of Electrical and Electronics Engineers

국가

USA

발행 상태

활성

데이터베이스 수록 정보

JCR 1999-2010 (12년)

SCI 2010-2011 (2년)

SCIE 2010-2011 (2년)

Scopus 1999-2010 (12년)

SJR 2000-2013 (14년)

전체 53건 중 1번부터 10번까지의 결과를 표시합니다.

2022

Article

Impact of Various Pulse-Bases on Charge Boost in Ferroelectric Capacitors

Kim, Gwon ;
Lim, Jaehyuk ;
Eom, Deokjoon ;
Choi, Yejoo ;
Kim, Hyoungsub ;
... Shin, Changhwan

2022-11
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2021

Article

Single Silicon Neuron Device Enabling Neuronal Oscillation and Stochastic Dynamics

Lim, D. ;
Cho, K. ;
Kim, S.

2021-05
IEEE Electron Device Letters
Institute of Electrical and Electronics Engineers Inc.

2020

Article

Analysis of Drain Linear Current Turn-Around Effect in Off-State Stress Mode in pMOSFET

Jung, Seung-Geun ;
Lee, Sul-Hwan ;
Kim, Choong-Ki ;
Yoo, Min-Soo ;
Yu, Hyun-Yong

2020-06
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2019

Article

Impact of Bottom-Gate Biasing on Implant-Free Junctionless Ge-on- Insulator n-MOSFETs

Lim, Hyeong-Rak ;
Kim, Seong Kwang ;
Han, Jae-Hoon ;
Kim, Hansung ;
Geum, Dae-Myeong ;
... Ju, Byeong-Kwon ;
외 3명

2019-09
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2018

Article

Low-Temperature Hybrid Dopant Activation Technique Using Pulsed Green Laser for Heavily-Doped n-Type SiGe Source/Drain

Kim, Seung-Geun ;
Kim, Gwang-Sik ;
Kim, Seung-Hwan ;
Yu, Hyun-Yong

2018-12
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

A Simple Method for Estimation of Silicon Film Thickness in T-Gate Junction less Transistors

Jeon, Dae-Young ;
Park, So Jeong ;
Mouis, Mireille ;
Barraud, Sylvain ;
Kim, Gyu-Tae ;
외 1명

2018-09
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Sol-Gel Processed p-Type CuO Phototransistor for a Near-Infrared Sensor

Lee, Sojeong ;
Lee, Won-Yong ;
Jang, Bongho ;
Kim, Taegyun ;
Bae, Jin-Hyuk ;
... Kim, Sangsig ;
외 2명

2018-01
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2017

Article

Efficient Threshold Voltage Adjustment Technique by Dielectric Capping Effect on MoS2 Field-Effect Transistor

Park, June ;
Kang, Dong-Ho ;
Kim, Jong-Kook ;
Park, Jin-Hong ;
Yu, Hyun-Yong

2017-08
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

HfZrOx-Based Ferroelectric Synapse Device With 32 Levels of Conductance States for Neuromorphic Applications

Oh, Seungyeol ;
Kim, Taeho ;
Kwak, Myunghoon ;
Song, Jeonghwan ;
Woo, Jiyong ;
외 3명

2017-06
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V

Ko, Eunah ;
Lee, Jae Woo ;
Shin, Changhwan

2017-04
IEEE Electron Device Letters
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC