ScholarWorks@Korea University

1. Journal Articles(College of Science and Technology > Display Convergence in Division of Display and Semiconductor Physics > 1. Journal Articles)48

Browse
rss_1.0 rss_2.0 atom_1.0

Subscribe to this collection to receive daily e-mail notification of new additions

Collection's Items (Sorted by 등록일자 in 내림차순 order): 21 to 40 of 48

SCIESCOPUS
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy

Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John

ArticleIssue Date2015CitationSCIENTIFIC REPORTS, v.5PublisherNATURE PUBLISHING GROUP
SCIESCOPUS
A Monte Carlo simulation for bipolar resistive memory switching in large band-gap oxides

Hur, Ji-Hyun; Lee, Dongsoo; Jeon, Sanghun

ArticleIssue Date2015CitationAPPLIED PHYSICS LETTERS, v.107, no.20PublisherAMER INST PHYSICS
SCIESCOPUS
Dislocation scatterings in p-type Si1-xGex under weak electric field

Hur, Ji-Hyun; Jeon, Sanghun

ArticleIssue Date2015CitationNANOTECHNOLOGY, v.26, no.49PublisherIOP PUBLISHING LTD
SCOPUSKCI
Beneficial effect of hydrogen in aluminum oxide deposited through the atomic layer deposition method on the electrical properties of an indium-gallium-zinc oxide thin-film transistor

Nam, Yunyong; Kim, Hee-Ok; Cho, Sung Haeng; Hwang, Chi-Sun; Kim, Taeho; Jeon, Sanghun; Park, Sang-Hee Ko

ArticleIssue Date2016CitationJOURNAL OF INFORMATION DISPLAY, v.17, no.2, pp.65 - 71PublisherTAYLOR & FRANCIS LTD
SCIESCOPUS
III-V compound semiconductors for mass-produced nano-electronics: theoretical studies on mobility degradation by dislocation

Hur, Ji-Hyun; Jeon, Sanghun

ArticleIssue Date2016CitationSCIENTIFIC REPORTS, v.6PublisherNATURE PUBLISHING GROUP
SCIESCOPUS
High mobility and high stability glassy metal-oxynitride materials and devices

Lee, Eunha; Kim, Taeho; Benayad, Anass; Hur, Jihyun; Park, Gyeong-Su; Jeon, Sanghun

ArticleIssue Date2016CitationSCIENTIFIC REPORTS, v.6PublisherNATURE PUBLISHING GROUP
SCIESCOPUS
Dislocation effects in FinFETs for different III-V compound semiconductors

Hur, Ji-Hyun; Jeon, Sanghun

ArticleIssue Date2016CitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.15PublisherIOP PUBLISHING LTD
SCIESCOPUS
The influence of interfacial defects on fast charge trapping in nanocrystalline oxide-semiconductor thin film transistors

Kim, Taeho; Hur, Jihyun; Jeon, Sanghun

ArticleIssue Date2016CitationSEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.31, no.5PublisherIOP PUBLISHING LTD
SCIESCOPUS
Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states

Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun

ArticleIssue Date2016CitationNANOTECHNOLOGY, v.27, no.21PublisherIOP PUBLISHING LTD
SCIESCOPUS
Effect of hydrogen on dynamic charge transport in amorphous oxide thin film transistors

Kim, Taeho; Nam, Yunyong; Hur, Ji-Hyun; Park, Sang-Hee Ko; Jeon, Sanghun

ArticleIssue Date2016CitationNANOTECHNOLOGY, v.27, no.32PublisherIOP PUBLISHING LTD
SCIESCOPUS
Synthesis of freestanding cupric oxide nanotubes with close ends from copper nanowires by the Kirkendall effect

Park, Sungho; Chae, Wonseok; Han, Manso; Jeon, Sanghun

ArticleIssue Date2016CitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.34, no.5PublisherA V S AMER INST PHYSICS
SCIESCOPUS
The Influence of Hydrogen on Defects of In-Ga-Zn-O Semiconductor Thin-Film Transistors With Atomic-Layer Deposition of Al2O3

Kim, Taeho; Nam, Yunyong; Hur, Jihyun; Park, Sang-Hee Ko; Jeon, Sanghun

ArticleIssue Date2016CitationIEEE ELECTRON DEVICE LETTERS, v.37, no.9, pp.1131 - 1134PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Photosensitivity of InZnO thin-film transistors using a solution process

Choi, Jongwon; Park, Junghak; Lim, Keon-Hee; Cho, Nam-kwang; Lee, Jinwon; Jeon, Sanghun; Kim, Youn Sang

ArticleIssue Date2016CitationAPPLIED PHYSICS LETTERS, v.109, no.13PublisherAMER INST PHYSICS
SCIESCOPUSKCI
Quantum Simulation Study on Performance Optimization of GaSb/InAs nanowire Tunneling FET

Hur, Ji-Hyun; Jeon, Sanghun

ArticleIssue Date2016CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.16, no.5, pp.630 - 634PublisherIEEK PUBLICATION CENTER
SCIESCOPUS
Polymer-Assisted Solution Processing of TiO2 Thin Films for Resistive-Switching Random Access Memory

Vishwanath, Sujaya Kumar; Jeon, Sanghun; Kim, Jihoon

ArticleIssue Date2017CitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.164, no.2, pp.H21 - H24PublisherELECTROCHEMICAL SOC INC
SCIESCOPUS
Influence of Fast Charging on Accuracy of Mobility in a-InHfZnO Thin-Film Transistor

Kim, Taeho; Choi, Rino; Jeon, Sanghun

ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.2, pp.203 - 206PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A theoretical modeling of photocurrent generation and decay in layered MoS2 thin-film transistor photosensors

Hur, Ji-Hyun; Park, Junghak; Jeon, Sanghun

ArticleIssue Date2017CitationJOURNAL OF PHYSICS D-APPLIED PHYSICS, v.50, no.6PublisherIOP PUBLISHING LTD
SCIESCOPUS
Defects and Charge-Trapping Mechanisms of Double-Active-Layer In-Zn-O and Al-Sn-Zn In-O Thin-Film Transistors

Goh, Youngin; Kim, Taeho; Yang, Jong-Heon; Choi, Ji Hun; Hwang, Chi-Sun; Cho, Sung Haeng; Jeon, Sanghun

ArticleIssue Date2017CitationACS APPLIED MATERIALS & INTERFACES, v.9, no.11, pp.9271 - 9279PublisherAMER CHEMICAL SOC
SCIESCOPUS
Determination of intrinsic mobility of a bilayer oxide thin-film transistor by pulsed I-V method

Woo, Hyunsuk; Kim, Taeho; Hur, Jihyun; Jeon, Sanghun

ArticleIssue Date2017CitationNANOTECHNOLOGY, v.28, no.17PublisherIOP PUBLISHING LTD
SCIESCOPUS
Model for the Operation of a Monolayer MoS2 Thin-Film Transistor with Charges Trapped near the Channel Interface

Hur, Ji-Hyun; Park, Junghak; Kim, Deok-kee; Jeon, Sanghun

ArticleIssue Date2017CitationPHYSICAL REVIEW APPLIED, v.7, no.4PublisherAMER PHYSICAL SOC
1 2 3

Discover

발행년도

자료유형

언어

저널 등재 구분

STATISTICS
Total View :7,977,919
Today View :7,368

RSS_1.0 RSS_2.0 ATOM_1.0

CONTACT US

(02841) 서울특별시 성북구 안암로 14502-3290-1114

COPYRIGHT © 2021 Korea University. All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

English