유현용 프로필 사진

유현용

Yu, Hyun Yong

공과대학

전기전자공학부

자료 필터

자료유형

발행연도

2012 ~ 2026
2012 2026

키워드

언어

선택된 필터

  • article
  • conference
  • book

전체 109건 중 61번부터 70번까지의 결과를 표시합니다.

2018
Article

Schottky Barrier Height Engineering for Electrical Contacts of Multilayered MoS2 Transistors with Reduction of Metal-Induced Gap States

  • Kim, Gwang-Sik ; 
  • Kim, Seung-Hwan ; 
  • Park, June ; 
  • Han, Kyu Hyun ; 
  • Kim, Jiyoung ; 
  • ... Yu, Hyun-Yong
  • 2018-06
  • ACS Nano
  • AMER CHEMICAL SOC
Article

Analytical study of polymer deposition distribution for two-dimensional trench sidewall in low-k fluorocarbon plasma etching process

  • Kim, Sun-Woo ; 
  • Zang, Hwan-Jun ; 
  • Park, June ; 
  • Kim, Gwang-Sik ; 
  • Yu, Hyun-Yong ; 
  • 외 4명
  • 2018-01
  • Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
  • A V S AMER INST PHYSICS
2017
Article

Fermi-Level Unpinning Technique with Excellent Thermal Stability. for n-Type Germanium

  • Kim, Gwang-Sik ; 
  • Kim, Seung-Hwan ; 
  • Lee, Tae In ; 
  • Cho, Byung Jin ; 
  • Choi, Changhwan ; 
  • ... Shim, Joon Hyung ; 
  • ... Yu, Hyun-Yong ; 
  • 외 2명
  • 2017-10-18
  • ACS Applied Materials & Interfaces
  • AMER CHEMICAL SOC
Article

An Electrical Analysis of a Metal-Interlayer-Semiconductor Structure on High-Quality Si1-xGex Films for Non-Alloyed Ohmic Contact

  • Kim, Seung-Geun ; 
  • Kim, Gwang-Sik ; 
  • Kim, Seung-Hwan ; 
  • Kim, Sun-Woo ; 
  • Park, June ; 
  • ... Yu, Hyun-Yong
  • 2017-10
  • Journal of Nanoscience and Nanotechnology
  • AMER SCIENTIFIC PUBLISHERS
Article

Investigation of Border Trap Characteristics in the AlON/GeO2/Ge Gate Stacks

  • Seo, Yujin ; 
  • Kim, Choong-Ki ; 
  • Lee, Tae-In ; 
  • Hwang, Wan Sik ; 
  • Yu, Hyun-Yong ; 
  • 외 2명
  • 2017-10
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Fermi Level Depinning in Ti/GeO2/n-Ge via the Interfacial Reaction Between Ti and GeO2

  • Seo, Yujin ; 
  • Lee, Tae In ; 
  • Ahn, Hyun Jun ; 
  • Moon, Jungmin ; 
  • Hwang, Wan Sik ; 
  • ... Yu, Hyun-Yong ; 
  • 외 1명
  • 2017-10
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Efficient Threshold Voltage Adjustment Technique by Dielectric Capping Effect on MoS2 Field-Effect Transistor

  • Park, June ; 
  • Kang, Dong-Ho ; 
  • Kim, Jong-Kook ; 
  • Park, Jin-Hong ; 
  • Yu, Hyun-Yong
  • 2017-08
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

The Impact of an Ultrathin Y2O3 Layer on GeO2 Passivation in Ge MOS Gate Stacks

  • Seo, Yujin ; 
  • Lee, Tae In ; 
  • Yoon, Chang Mo ; 
  • Park, Bo-Eun ; 
  • Hwang, Wan Sik ; 
  • ... Yu, Hyun-Yong ; 
  • 외 2명
  • 2017-08
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Formation of Low-Resistivity Nickel Germanide Using Atomic Layer Deposited Nickel Thin Film

  • Ahn, Hyun Jun ; 
  • Moon, Jungmin ; 
  • Seo, Yujin ; 
  • Lee, Tae In ; 
  • Kim, Choong-Ki ; 
  • ... Yu, Hyun-Yong ; 
  • 외 2명
  • 2017-06
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Impact of Metal Nitrides on Contact Resistivity of Metal-Interlayer-Semiconductor Source/Drain in Sub-14 nm n-Type Si FinFET

  • 2017-05
  • Journal of Nanoscience and Nanotechnology
  • AMER SCIENTIFIC PUBLISHERS