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SCISCIESCOPUS
A Simple Method for Estimation of Silicon Film Thickness in T-Gate Junction less Transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2018CitationIEEE ELECTRON DEVICE LETTERS, v.39, no.9, pp 1282 - 1285PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Analysis of charge sensitivity and low frequency noise limitation in silicon nanowire sensors

Lee, Jae Woo; Jang, Doyoung; Kim, Gyu Tae; Mouis, Mireille; Ghibaudo, Gerard

ArticleIssue Date2010CitationJOURNAL OF APPLIED PHYSICS, v.107, no.4PublisherAMER INST PHYSICS
SCISCIESCOPUS
Behavior of subthreshold conduction in junctionless transistors

Park, So Jeong; Jeon, Dae-Young; Montes, Laurent; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2016CitationSOLID-STATE ELECTRONICS, v.124, pp 58 - 63PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Channel access resistance effects on charge carrier mobility and low-frequency noise in a polymethyl methacrylate passivated SnO2 nanowire field-effect transistors

Joo, Min-Kyu; Huh, Junghwan; Mouis, Mireille; Park, So Jeong; Jeon, Dae-Young; Jang, Doyoung; Lee, Jong-Heun; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2013CitationAPPLIED PHYSICS LETTERS, v.102, no.5PublisherAMER INST PHYSICS
SCISCIESCOPUS
Effect of Intertube Junctions on the Thermoelectric Power of Monodispersed Single Walled Carbon Nanotube Networks

Piao, Mingxing; Joo, Min-Kyu; Na, Junhong; Kim, Yun-Jeong; Mouis, Mireille; Ghibaudo, Gerard; Roth, Siegmar; Kim, Wung-Yeon; Jang, Ho-Kyun; Kennedy, Gary P., et al.

ArticleIssue Date2014CitationJOURNAL OF PHYSICAL CHEMISTRY C, v.118, no.46, pp 26454 - 26461PublisherAMER CHEMICAL SOC
SCISCIESCOPUS
Effects of channel width variation on electrical characteristics of tri-gate Junction less transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2013CitationSOLID-STATE ELECTRONICS, v.81, pp 58 - 62PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Experimental and Theoretical Investigation of Magnetoresistance From Linear Regime to Saturation in 14-nm FD-SOI MOS Devices

Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Mukhopadhyay, Sutirtha; Piot, Benjamin; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2015CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.62, no.1, pp 3 - 8PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCISCIESCOPUS
Flat-band voltage and low-field mobility analysis of junctionless transistors under low-temperature

Joo, Min-Kyu; Mouis, Mireille; Jeon, Dae-Young; Barraud, Sylvain; Park, So Jeong; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2014CitationSEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.29, no.4PublisherIOP PUBLISHING LTD
SCISCIESCOPUS
Full split C-V method for parameter extraction in ultra thin BOX FDSOI MOS devices

Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2014CitationSOLID-STATE ELECTRONICS, v.99, pp 104 - 107PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Impact of series resistance on the operation of junctionless transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2017CitationSOLID-STATE ELECTRONICS, v.129, pp 103 - 107PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
In depth characterization of electron transport devices in 14 nm FD-SOI CMOS

Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2015CitationSOLID-STATE ELECTRONICS, v.112, pp 13 - 18PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Less mobility degradation induced by transverse electric-field in junctionless transistors

Park, So Jeong; Jeon, Dae-Young; Montes, Laurent; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2014CitationAPPLIED PHYSICS LETTERS, v.105, no.21PublisherAMER INST PHYSICS
SCISCIESCOPUS
Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions

Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2015CitationSOLID-STATE ELECTRONICS, v.108, pp 30 - 35PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Low-frequency noise behavior of junctionless transistors compared to inversion-mode transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2013CitationSOLID-STATE ELECTRONICS, v.81, pp 101 - 104PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Low-temperature electrical characterization of junctionless transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2013CitationSOLID-STATE ELECTRONICS, v.80, pp 135 - 141PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2014CitationAPPLIED PHYSICS LETTERS, v.105, no.26PublisherAMER INST PHYSICS
SCISCIESCOPUS
Magnetoresistance mobility characterization in advanced FD-SOI n-MOSFETs

Shin, Minju; Shi, Ming; Mouis, Mireille; Cros, Antoine; Josse, Emmanuel; Mukhopadhyay, Sutirha; Piot, Benjamin; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2015CitationSOLID-STATE ELECTRONICS, v.103, pp 229 - 235PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Mobility analysis of surface roughness scattering in FinFET devices

Lee, Jae Woo; Jang, Doyoung; Mouis, Mireille; Kim, Gyu Tae; Chiarella, Thomas; Hoffmann, Thomas; Ghibaudo, Gerard

ArticleIssue Date2011CitationSOLID-STATE ELECTRONICS, v.62, no.1, pp 195 - 201PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
New method for the extraction of bulk channel mobility and flat-band voltage in junctionless transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2013CitationSOLID-STATE ELECTRONICS, v.89, pp 139 - 141PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Separation of surface accumulation and bulk neutral channel in junctionless transistors

Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Joo, Min-Kyu; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard

ArticleIssue Date2014CitationAPPLIED PHYSICS LETTERS, v.104, no.26PublisherAMER INST PHYSICS
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