Yoon, Daekeun; Kim, Jungsoo; Yun, Jongwon; Kaynak, Mehmet; Tillack, Bernd; Rieh, Jae-Sung
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, v.7, no.5, pp.536 - 545PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC