Kim, Jungsoo; Yoon, Daekeun; Yun, Jongwon; Song, Kiryong; Kaynak, Mehmet; Tillack, Bernd; Rieh, Jae-Sung
ArticleIssue Date2018CitationIEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, v.8, no.5, pp.482 - 491PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC